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产品介绍

自动光学检测机 (AOI)

TR7700Q TB SII

INTRODUCTION

The TR7700Q TB SII offers 3D Top-view and 2D Bottom-view inspection designed for high coverage detection of Through-hole technology (THT), Dual-in-line Package (DiP), and SMD defects. The newly released AOI is equipped with TRI’s innovative AI-powered algorithms and metrology-grade measurements for precision inspection. The Smart Factory Ready solution is capable of data exchange, eases MES connectivity, and supports current smart factory standards, such as IPC-CFX, IPC-DPMX, and The Hermes Standard (IPC-HERMES-9852).
• High-Speed 3D Top-view and 2D Bottom-view AOI, up to 57 cm2/sec
• High Defect Coverage Inspection for THT/DIP
• AI-powered Algorithms with Smart Programming
• Metrology-grade Inspection for precise measurements
• Industry 4.0 Ready Platform