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In-Circuit Tester (ICT)



Next generation ICT+FCT solution offers breakthrough performance Multi-Core Parallel/Merged Core testing with up to 4 independent cores for high-throughput testing. TRI's most advanced manual handler features industry-approved hands-free safety design for uninterrupted operation, and built-in auto-calibration ensures long-term testing reliability.
• New Generation Flexible Multi-Core Parallel / Merged-Core Tester
• State-of-the-Art Serial Test Controller with up to 8 ports on any pin
• Industry-approved hands-free testing platform for maximum operator safety
• Limited access solution and functional test expansion using PXI modules
• Built-in Self Diagnostics and Auto-Calibration function
• High-Accuracy Measurement and Testing
• Intuitive UI with flow-based easy program development