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In-Circuit Tester (ICT)



Next generation ICT+FCT solution offers breakthrough performance Multi-Core Parallel testing with up to 4 independent cores for high-throughput testing. Offering improved measurement accuracy, the TR5001Q/D SII's new built-in auto-calibration and self diagnostics ensure long-term testing reliability.
• New Generation Flexible Multi-Core Parallel Tester 
• State-of-the-Art Serial Test Controller with up to 8 ports on any pin 
• Limited access solution and functional test expansion using PXI modules 
• Built-in Self Diagnostics and Auto-Calibration function 
• High-Accuracy Measurement and Testing 
• Intuitive UI with flow-based easy program development