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In-Circuit Tester (ICT)


  • TR5001DV_SII


Top-of-the-line multi-core parallel vacuum ICT+FCT solution. TR5001V SII Series offers breakthrough performance with up to 4 independent cores for high throughput. Includes durable Quick Disconnect Interface together with built-in auto-calibration and self-diagnostics ensure long-term testing reliability. TR5001V SII Series is powered by TRI's flow-based Smart Programming Software for ease of use.
• Multi-Core Parallel Test
• Reliable Vacuum Fixture Testing
• Non-Multiplexing 1:1 per Pin Architecture
• Scalable MDA to ICT and Functional Test
• High Accuracy and High Throughput
• Durable Quick Disconnection Interface