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About Us

Yield Management System 4.0


Yield Management System 4.0 (YMS 4.0) is TRI's centralized monitoring software that interconnects inspection solutions from SPI, AOI, AXI and ICT. YMS 4.0 promotes continuous improvement of the production line's yield rate by offering statistical analysis of production line defect rates, reviewing and fine-tuning inspection results, and identifying component defect trends and emerging production issues.

 

Advantages



 

Visualize
 

     
Real-time visibility of the inspection results and production line's performance to empower operators and plant managers to make informed decisions. Visualize machine status and production efficiency in real-time with dashboards that include SPC trends, inspection images and machine status.

Live Inspection Status
 

Monitor
 

     
 
Remote Alarms
 
Easily configure triggers that will send alarms to the YMS 4.0 Control Center and desired user. The Alarms can include suggested actions so the operator can follow them to fix the issue. Remote alarms will help operators to quickly identify trends and browse alarm history to aid in operation maintenance.

 
Remote Control
 
Inspection machines PC to ease support, troubleshooting, maintenance, and perform fine-tuning remotely from the comfort of your Control Center. The Remote Control comes in handy when in need to address issues and troubleshooting in a faster manner.
Line View Monitoring
 

Optimize
 

     
YMS 4.0 eases data traceability from component defect values to inspection images throughout the production line. Achieve the desired performance by detecting the root defect cause and adjusting the programming remotely from the YMS 4.0, reducing operators' workload.

Defect Image Analyzer


 

YMS 4.0 APP
 

     
Portable monitoring experience for your production line's inspection data and alarm notifications. User-friendly interface to access real-time statistical data such as the yield rate, inspection images, top defects and top defective components from the comfort of your mobile device.