News

[November 20, 2025 – Nuremberg, Germany] Test Research, Inc. (TRI) is proud to announce that its High-Pin-Count In-Circuit Tester, the TR8100 SII Series, has received a 2025 Global Technology Award in the Test Equipment category. This award recognizes the system's innovative solution for testing large, complex PCBAs.

The TR8100 SII is engineered to meet the rising demand for advanced AI server and data center boards. It offers an industry-leading high-pin-count ICT + FCT solution with up to 11,088 test points, providing unparalleled accuracy and throughput for today's most complex electronics.

Key innovations include a non-multiplexing 1:1 per-pin architecture for accelerated test speeds and seamless compatibility with legacy TRI modules, fixtures, and test programs, ensuring a cost-effective and rapid deployment.

For more information about the TR8100 SII, please visit,
https://www.tri.com.tw/en/product/product_detail-14-2-1649-1.html

 

About the Global Technology Awards
The Global Technology Awards have recognized the very best innovations in the printed circuit assembly and packaging industries since 2005. The awards are designed to promote best practices in key areas including manufacturing quality, customer service, sales growth, innovation, and employee motivation.

About Test Research, Inc.
Test Research, Inc. (TRI) offers the Industry's most robust portfolio of AI-powered, Smart Factory-ready Automatic Test and Inspection solutions. TRI's lineup includes Solder Paste Inspection (SPI), Automated Optical Inspection (AOI), 3D Automated X-ray Inspection (AXI), Manufacturing Defect Analyzers (MDAs), and In-Circuit Test (ICT), providing cost-effective solutions for all manufacturing requirements. Learn more at http://www.tri.com.tw. For sales and service information, please write to us at marketing@tri.com.tw or call +886-2-2832 8918.