News

[September 10, 2023 – Taipei, Taiwan] Test Research, Inc. (TRI) proudly presents the TR7600 SV Series. The 3D AXI breakthrough outperforms its predecessor, the award-winning TR7600 Series, by a staggering 20% increase in performance.

With a remarkable 7 µm resolution, the TR7600 SV guarantees high resolution and high-yield-rate inspection. TRI's AXI is equipped with AI algorithms, which are superior to the commonly used gray-level-based algorithms. The AI algorithm can accurately detect void defects.

Industries ranging from automotive electronics to telecommunications and high-throughput production sectors will benefit from the TR7600 SV Series' fast image reconstruction and defect detection capabilities. Unlike competitors, TRI's X-ray inspection solutions secure the sample on the conveyor while inspecting, preventing further damage. The system offers adjustable imaging parameters for tailored inspections and inline fine-tuning capabilities.

The TR7600 SV supports current Smart Factory Standards, including the IPC-CFX, IPC-DPMX, and The Hermes Standard (IPC-HERMES-9852).
 
For more information about the TR7600 SV Series, please visit the link below,
https://www.tri.com.tw/en/product/product_detail-12-2-1678.html
 

About TRI

Test Research, Inc. (TRI) provides the most cost-effective solutions to meet a comprehensive range of manufacturing test and inspection requirements, from Automatic Test and Inspection solutions to Board Testing. Learn more at http://www.tri.com.tw. For sales and service information, please write to us at marketing@tri.com.tw or call +886-2-2832 8918.