新聞中心

[July 26, 2017 – Taipei, Taiwan] Test Research, Inc. (TRI) formally announces discontinuation of parallel test functionality for the TR5001T SII TINY in-circuit test equipment.

The TR5001T SII TINY is a leading in-circuit test solution for small PCBA assemblies offering a unique set of capabilities. In order to better match market demand, TRI has decided to allocate parallel test functionality to the TR5001 SII multi-core in-circuit tester series.

Customers who require high-performance parallel test solutions are encouraged to inquire about the TR5001 SII in-circuit tester series with dual and quad core solutions, including inline and offline options.

Product Line	Model	Phase-out Date	Suggested Replacement
In-Circuit Tester	TR5001T SII TINY (multi-tester parallel testing)	July 31, 2017	TR5001D/Q SII TR5001D/Q SII QDI TR5001D/Q SII INLINE

The TR5001T SII TINY remains fully supported as a standalone single-core test solution.

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About TRI

TRI offers the most robust product portfolio in the industry for Automatic Test and Inspection solutions. From Solder Paste Inspection (SPI), Automated Optical Inspection (AOI), and 3D Automated X-ray Inspection (AXI) systems to Manufacturing Defect Analyzers (MDAs) and In-Circuit Test equipment, TRI provides the most cost-effective solutions to meet a comprehensive range of manufacturing Test and Inspection requirements. Learn more at http://www.tri.com.tw. For sales and service information, write us at marketing@tri.com.tw or call +886-2-2832 8918.