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TRI Introduces New Tiny ICT and TR7700 SIII AOI at NEPCON South China

2013/08/03

TRI Introduces New Tiny ICT and TR7700 SIII AOI at NEPCON South China

[August 3, 2013 – Taipei, Taiwan] Test Research, Inc. (TRI) will introduce its next generation TR5001 SII Tiny ICT and TR7700 SIII, its newest AOI solution at NEPCON South China in Shenzhen Convention & Exhibition Center between August 27 and 29, 2013. Visit our booth C-022 for a personal introduction.

 

TR5001 SII TINY is a new generation of TRI’s successful compact & portable ICT solution. Offering up to 640 testing points and extending coverage with Boundary Scan, the TR5001T SII TINY brings an extended ICT feature set in the industry's most compact and affordable solution. The new generation desktop ICT offers parallel testing using multiple USB-connected units, Audio analyzer and Data acquisition modules and multiple programmable power supplies for testing devices and LED strips.
TR7700 SIII is the newest generation of TRI's AOI solutions, delivering precise multi-phase inspection at full speed. By combining an ultra-fast camera, intelligent auto conveyor, and new GUI, the TR7700 SIII offers a powerful and easy to use AOI solution with fast programming, optimized board loading, production line integration and support for offline programming. TRI's new color algorithm combined with multiple lighting phases increase defect coverage and help deliver highly accurate inspection results with a minimum of false calls.

Commenting on the new products at NEPCON South China, TRI’s VP of Sales and Marketing Jim Lin noted: “The new generation of TRI’s solutions embodies our focus on the needs of our customers, both big and small.”
Come to our NEPCON China exhibit to discover how the featured solutions can help you improve production quality and minimize costs. Our booth C-022 will showcase the following solutions.

About TRI
TRI offers the most robust product portfolio in the industry for Automatic Test and Inspection solutions. From Solder Paste Inspection (SPI), Automated Optical Inspection (AOI), and 3D Automated X-ray Inspection (AXI) systems to Manufacturing Defect Analyzers (MDAs) and In-Circuit Test equipment, TRI provides the most cost-effective solutions to meet a comprehensive range of manufacturing Test and Inspection requirements. Learn more at http://www.tri.com.tw. For sales and service information, write us at sales@tri.com.tw or call +886-2-2832 8918.