[August 27, 2019 – Taipei, Taiwan] Test Research, Inc. (TRI), the leading test and inspection systems provider for the electronics manufacturing industry, is pleased
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to announce the launch of the next generation of 3D AXI, TR7600F3D SII. The Innovative Inspection solution achieves speeds as to twice to three times as fast as the previous-generation models. The TR7600F3D SII is equipped with a high-resolution flat panel detector for supporting high accuracy full-range inspection. The AXI solution can inspect large boards, up to 900 mm x 460 mm. The TR7600F3D SII solution delivers exceptional speed and performance, improving the production line
's efficiency.
TRI is also proud to announce the new inline 3D AXI TR7600TL SIII with CT capabilities specialized, designed for the inspection of extra-large board sizes, up to 1200mm x 660mm. The robust platform of the TR7600TL SIII ensures quality inspection lowering the escapes and false calls.
For a live demonstration of the TR7600F3D SII visit TRI
's booth #1H55 at NEPCON ASIA 2019 held at the Shenzhen Exhibition & Convention Center.
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