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[August 12, 2024 – Taipei, Taiwan] OmniMeasure, TRI's SEMI inspection partner, will present at the Semiconductor Advanced Inspection and Metrology Forum. The forum will be hosted alongside SEMICON Taiwan on Friday, September 6, from 8:30 am to 4:20 pm at the 4F, Taipei Nangang Exhibition Center Hall 1.

Dr. Hung-Ming Tai, CTO of OmniMeasure, will present a session titled "Wafer-level Inspection System for High Aspect-Ratio TSV in Heterogeneous Integration Packaging." TRI's Advanced WLP/PLP and Back-End Inspection Solutions will be showcased during the presentation. For more details about OmniMeasure's presentation, please visit the session's page.

Visit TRI's booth #N0990 to see the TSV Metrology Module in action, powering TRI's TR7950Q SII Wafer Inspection and Metrology solution..

 

About TRI

Test Research, Inc. (TRI) offers the most robust product portfolio in the industry for Automatic Test and Inspection solutions. TRI provides the most cost-effective solutions to meet a comprehensive range of manufacturing Test and Inspection requirements. Learn more at http://www.tri.com.tw. For sales and service information, please write to us at marketing@tri.com.tw or call +886-2-2832 8918.

About OmniMeasure Technology Inc.

OmniMeasure Technology Inc. specializes in advanced modules and equipment for critical dimension inspection and metrology in semiconductor manufacturing. With a team of experts, OmniMeasure's solutions enhance process quality and efficiency for global semiconductor and optoelectronic industries. OmniMeasure focuses on the measurement solutions for HPC, AI, 3D IC chip design, and advanced packaging technologies. OmniMeasure offers semiconductor inspection systems, services, and optical instruments. Visit www.omsure.com or contact info@omsure.com for more information.