ニュース

[February 16, 2017 – Taipei, Taiwan] Test Research, Inc. (TRI), a leading test and inspection system provider for the SMT industry proudly announces that the company’s new generation ICT tester, TR5001 SII Series, received CIRCUITS ASSEMBLY’s 2017 NPI Award at a ceremony held during the 2017 IPC APEX show in San Diego, CA.

TRI is one of the preeminent suppliers of test and inspection systems for the electronics industry in China and around the world. As the only total solution vendor — with SPI, AOI, AXI, MDA, ICT and FCT systems — TRI focuses on integrated production quality management and providing valuable data for Industry 4.0 manufacturing.

The TR5001 SII multi-core in-circuit tester offers high-throughput parallel board testing and an advanced feature set, including high accuracy measurement, multiple routable serial ports, fast programming and debugging, and advanced DUT overdrive protection. Designed for extensive compatibility, the new ICT tester is a great upgrade option for current TRI ICT customers.


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About the NPI Awards
CIRCUITS ASSEMBLY'S New Product Introduction (NPI) Awards recognize the leading new products for electronics assembly during the past 12 months. Awards are selected by an independent panel of practicing industry engineers, and are presented by CIRCUITS ASSEMBLY — to determine the best new technologies and services introduced in the previous year. NPI Awards have been recognizing industry excellence since 2007.