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TRI Receives 2013 EM Asia Innovation Award for TR5001T TINY ICT

2013/04/30

[April 29, 2013 – Taipei, Taiwan] Test Research, Inc. (TRI), a leading test and inspection systems provider for the electronics manufacturing industry, announced today that its widely acclaimed TR 5001 TINY In-Circuit Tester has been awarded a prestigious 2013 EM Asia Innovation Award in the category of Test & Measurement/Inspection Systems: ICT. The award was presented on April 24, 2013 in a ceremony held during NEPCON China in Shanghai.

Commenting on the occasion, TRI’s VP of Sales and Marketing Jim Lin noted, “TRI proudly receives the EM Asia Innovation award on behalf of its brilliant engineering team. Honored with its second industry award, the success of our Tiny ICT demonstrates TRI’s continued attention to the needs of our customers and our company’s innovative spirit when developing quality management solutions.”

The TR5001T TINY In-circuit Tester is a feature-rich board tester with a laptop-sized footprint that offers advanced analog and digital testing in a cost-efficient alternative to large in-circuit testers. Equipped with a USB interface, the TR5001T can use up to 640 analog test points and 16 bidirectional digital pins.

Established in 2006, the EM Asia Innovation Awards program strives to recognize and celebrate excellence in the Asian electronics industry, inspiring companies to achieve the highest standards and push the industry forward.

About TRI
TRI offers the most robust product portfolio in the industry for Automatic Test and Inspection solutions. From Solder Paste Inspection (SPI), Automated Optical Inspection (AOI), and 3D Automated X-ray Inspection (AXI) systems to Manufacturing Defect Analyzers (MDAs) and In-Circuit Test equipment, TRI provides the most cost-effective solutions to meet a comprehensive range of manufacturing Test and Inspection requirements. Learn more at http://www.tri.com.tw. For sales and service information, write us atsales@tri.com.tw or call+886-2-2832 8918