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TRI Focuses on Micro Components at SEMICON Taiwan 2016

2016/08/04

[August 4, 2016 – Taipei, Taiwan] Test Research, Inc. (TRI) will feature new SPI and AOI solutions specialized at micro SMD inspection. Combining 6 µm resolution with optional vacuum fixtures, TRI inspection systems are ready to inspect micro components on a variety of substrates. Visit us at booth 982 on 4F at Taipei Nangang Exhibition Center on September 7 ~ 9, 2016 and discover TRI's latest solutions for the semiconductor and electronics industry.
Presented at SEMICON Taiwan, TRI's 2016 booth will feature the TR7007Q SPI and TR7700Q AOI systems, based on TRI's latest digital fringe projection technology. The specialized inspection systems include a vacuum-based fixture for accurate handling of thin and flexible substrates.

Discover TRI's new micro SMD and packaging inspection solutions at booth 982 on 4F of SEMICON Taiwan 2016.
TR7700Q 3D AOI SystemTR7700Q 3D AOI Solution

About TRI


TRI offers the most robust product portfolio in the industry for Automatic Test and Inspection solutions. From Solder Paste Inspection (SPI), Automated Optical Inspection (AOI), and 3D Automated X-ray Inspection (AXI) systems to Manufacturing Defect Analyzers (MDAs) and In-Circuit Test equipment, TRI provides the most cost-effective solutions to meet a comprehensive range of manufacturing Test and Inspection requirements. Learn more at http://www.tri.com.tw. For sales and service information, contact us at marketing@tri.com.tw or call +886-2-2832-8918.