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| TR518FE is TRI's new generation model developed after the TR518F using more advanced component and software technologies. The main distinctive feature lies with its fast testing speed, which is twice as fast as traditional ICT. Further more, it possesses a more programmable short and open circuit learning setting, satisfying different varieties of test products and their behaviors. It is definitely the best two in one machine for high pin products or mass production, when it comes to saving costs on the fixture or the tester itself. |
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TR518FE
Comprehensive Features: |
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The most popular ICT model in the information industry |
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Worldwide installed bases and worldwide support |
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High Speed, High Coverage |
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ISO9001 Certified, "Symbol of Excellence" Approved |
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Powerful Sofeware Environment |
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MS-Windows Version system software, friendly user interface designed |
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Auto-Learning and Automatic Program Generation of Open/Short, Pin Information, IC Clamping Diode, TestJet Technology... |
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Automatic Guarding points selection |
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Built in System Self-Diagnostic function |
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Practical quality management and statistic report available |
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Networking available |
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BoardView function can allocate defect device and pin instantly |
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Comprehensive Hardware Structure Design |
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High-End semiconductor CMOS Switching design, permitting no life limitation concern |
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Test interface available in Press Type, Vacuum Type and Off-Line, In-Line |
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High capacity rack design, test points up to 3584 |
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Auto-Alignment function expandable |
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Multiple Safety Protection design |
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Advanced Testing Technologies Integration |
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TestJet Technology, the best solution to cover most SMT IC lead soldering defect |
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With IC Clamping Diode test technologies, can enhance the testing coverage of BGA package |
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Alternative learning module can automatically generate IC Reverse Check program |
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Leakage current measurement is able to detect polarity of Capacitor |
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1MHz AC signal for testing small Capacitor and Inductor |
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Transistor, FET, SCR, and Photo Coupler testing mode available |
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Pin Contact Check capability |
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| Board View Function |
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Intel Socket Test Technology |
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MOTOROLA |
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INTEL |
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DELL |
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HP |
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THOMSON |
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VIASYSTEMS |
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INVENSYS |
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SIEMENS |
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PHILIPS |
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HITACHI |
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BROTHER |
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TDK |
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SHARP |
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MATSUSHITA |
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DENSO |
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MITSUBISHI |
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TEAC |
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SONY |
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RICOH |
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SANYO |
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SOLECTRON |
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NEC |
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JABIL |
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SANMINA-SCI |
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TG |
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KONKA |
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TPV |
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HAIER |
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TCL |
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SAMSUNG |
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LG |
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