ニュース

[March 6, 2018 – Taipei, Taiwan] Test Research, Inc. (TRI), the leading test and inspection system provider for the SMT industry proudly announces that the company’s new generation AOI, TR7700Q, received CIRCUITS ASSEMBLY’s 2018 NPI Award at a ceremony held during the 2018 IPC APEX show in San Diego, CA, USA.  

TRI is one of the preeminent suppliers of test and inspection systems for the electronics industry in the world. As the only total solution vendor — with SPI, AOI, AXI, MDA, ICT and FCT systems — TRI focuses on integrated production quality management and providing valuable data for Industry 4.0 manufacturing.
 

The TR7700Q is TRI’s latest innovation, introducing Depth from Focus (DFF) a newly developed 3D image processing technology. The DFF technology delivers optimal focus and sharper images for higher quality inspection. Among its many innovative features, TR7700Q has equipped several 3D Methodologies: Fringe pattern, Laser, and Depth from Focus, with Stop-and-Go imaging. TR7700Q is the most versatile AOI machine in the market, with advanced 3D inspection capabilities and high performance and ease of use. TR7700Q offers significant production savings while reducing labor costs and minimizing downtime when introducing new products.

About TRI

TRI offers the most robust product portfolio in the industry for Automatic Test and Inspection solutions. From Solder Paste Inspection (SPI), Automated Optical Inspection (AOI), and 3D Automated X-ray Inspection (AXI) systems to Manufacturing Defect Analyzers (MDAs) and In-Circuit Test equipment, TRI provides the most cost-effective solutions to meet a comprehensive range of manufacturing Test and Inspection requirements. Learn more at http://www.tri.com.tw. For sales and service information, write us at marketing@tri.com.tw or call +886-2-2832 8918.