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TR5001 includes a mix of MDA, ICT and functional testing within one platform, allowing a complete optional testing model which provides an economical testing solution according to the needs of customers.
TR5001 incorporates ICT & Functional test that cut production line staff costs, save testing time lengths and increase productivity.
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High-Fault Coverage Test Solution |
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Supports Cost Down Solution with Optional Analog and Hybrid Boards |
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Most Competitive Rapid Test Speed |
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Supports Digital 1:1 Driver/Receiver per Pin Architecture Design |
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Powerful Boundary Scan Test (1149.6) Solutions |
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Modularized Test System |
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Open Source Code Structure |
Cost-Effective, Modularized Press-Type Test System
The press type system is more economical than vacuum type board testers, with fixture costs reduced by over 50%. Customers can start with a basic manufacturing defects analyzer (MDA) and easily add functions such as in-circuit test, functional test, on-board programming , and IEEE 1149 boundary scan when needed.
Full-Featured Analog MDA Can Upgrade to Digital In-Circuit Tester
The TR5001's modular design allows for all analog or mixed (hybrid) analog/digital testing. With a maximum 3,200 analog test points, the TR5001 uses a digital signal and filter to improve analog test performance and speed – much better than traditional MDAs.
When upgraded to a digital in-circuit tester, the TR5000 offers a maximum of 1,600 analog/digital test points, low-voltage device test capability, high pin-count BGA testing, and enhanced On-board Flash programming (OBP) capability.
Supports Digital 1:1 Driver/Receiver per Pin Architecture Design
TRI's efficient design means all pins are drive/receive: there is no multiplexing, no wasted pins. This lowers system cost for large pin-count devices and allows for fast test program development, as no vector model is required before fixture development. Engineering changes to fixtures are simpler and cheaper to perform.
Convenient On-Board Prgramming Solution Saves Time, Money
On-board programmable components, such as Flash memory and other PLDs (Programmable Logic Devices) can provide board designers and manufacturers great flexibility and cost savings. TRI helps reduce component inventory and handling costs by allowing these devices to be programmed during the test phase instead of being programmed off-line and then assembled onto the PCBA. The TR5001's OBP function
allows changes to the programmed data, making ECOs easier and cheaper to implement,
No Access Test Solutions
TRI board testers are already prepared for the reduced test access found on more and more PCBAs. In addition to offering Boundary Scan testing, TRI has developed other no-test access solutions, notably ToggleScan (based on the draft IEEE 1149.8.1 specification), a socket sensor test and other innovative test methods.
HDI designs feature microvias, which allow for a greater number of components, but eliminate the traditional test pad: there is no place to put a standard test probe
ToggleScan solves this problem by sensing the test signal through the target device.