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Company Milestones
- 1989
- Founding of Test Research Inc., TRI
- 1990
- Successful development of TR518 Manufacturing Defects Analyzer
- 1991
- D-Link placed order for TR518
- 1993
- Introduction of TR518F
- 1994
- Introduced HP TestJet technology and became the first authorized brand in China.
- 1995
- Introduced In-Line type TR518
- 1996
- Introduced TR518FE which was honored with the Symbol of Excellence (SOE) Award.
- 1997
- Introduced TR518FR which was also honored with SOE Award.
- 1999
- Launched semiconductor tester TR6005.
- 1999
- Chosen as one of the top 100 fast growing major Taiwan
enterprises, by the CommonWealth Magazine
- 1999
- TRI Electronics (Shenzhen) Co., Ltd established.
- 1999
- Launched semiconductor tester TR6010.
- 2000
- Launched TR8001 In-Circuit Tester.
- 2000
- HsinChu design & solutions office established.
- 2001
- Acquired TestJet Technology permanent authorization.
- 2001
- Listed on Taiwan's Over The Counter market.
- 2001
- TRI Electronics (Suzhou) Co., Ltd established.
- 2002
- TR8001 received Taiwan SOE Award.
- 2002
- Listed on the Taiwan Stock Exchange .
- 2002
- Test Research USA, Inc. established.
- 2002
- Launched semiconductor testers TR6020, TR6050 and TR7100 Automated Optical Inspection (AOI) system .
- 2003
- Test Research Singapore Pte Ltd established.
- 2003
- Launched semiconductor testers TR6800 and TR7100EP AOI system.
- 2004
- Introduced TR7006 3D Solder Paste Inspection system.
- 2005
- TRI Electronics Trading (Shanghai) Co., Ltd.
- 2005
- Launched TR5001V In-Circuit Tester
Introduced YMS (Yield Management System) which utilizes the intelligent
Test Software Solutions to combine SPI, AOI, ICT and ATE testing system.
- 2006
- Launched semiconductor tester TR6850 and TR7500 AOI system
Introduced TR7100EP which was honored with the EM Asia Awards.
- 2007
- Launched TR7600 Automated X-Ray Inspection (AXI) System.
- 2007
- TRI Test Research Europe GmbH established.
- 2008
- TRI Japan Corporation established.
- 2008
- New factory opened in Linkou, Taiwan
- 2008
- TRI won the EM Asia Best Supplier Award
- 2009
- Presented paper at International Test Conference (ITC) introducing VregTest solution.
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2012 Events |
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Jan. 18-20 Nepcon Japan
Feb. 28-Mar. 1 APEX Show
Apr. 25-27
Nepcon China
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